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TDS3034C - 

Digital Oscilloscope, TDS3000C Series, 4 Channel, 300 MHz, 2.5 GSPS, 10 kpts, 1.2 ns

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Manufacturer:
TEKTRONIX TEKTRONIX
Manufacturer Part No:
TDS3034C
Newark Part No.:
84M7361
Product Range
TDS3000C Series
Technical Datasheet:
TDS3034C   Datasheet
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Product Information

:
TDS3000C Series
:
4 Channel
:
300MHz
:
2.5GSPS
:
10 kpts
:
1.2ns
:
VGA LCD Color
:
One 500MHz P6139A Passive Probe Per Channel (10:1), OpenChoice Desktop Software, NI LabVIEW SignalExpress Tektronix Edition LE Software, Accessory Tray, Front Cover, Certificate of Calibration
:
3 Years
:
US
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Product Overview

The TDS3034C combines unique digital real-time (DRT) sampling technology with sin(x)/x interpolation to allow you to accurately characterise a wide range of signal types on all channels simultaneously. There is no change in sampling rate when additional channels are turned on. This sampling technology makes it possible to capture high-frequency information, such as glitches and edge anomalies, that elude other oscilloscopes, while sin(x)/x interpolation ensures precise reconstruction of each waveform.
  • 10 k Standard Record Length on All Channels
  • 3,600 wfms/s Continuous Waveform Capture Rate
  • Suite of Advanced Triggers
  • Front-panel USB Host Port for Easy Storage and Transfer of Measurement Data
  • 25 Automatic Measurements
  • FFT Standard
  • Multiple Language User Interface
  • WaveAlert® Automatic Waveform Anomaly Detection
  • TekProbe Interface Supports Active, Differential, and Current Probes for Automatic Scaling and Units
  • Lightweight Design (only 7 lb./3.2 kg) for Easy Transport
  • Digital real-time sampling
  • Digital phosphor display
  • Only 149mm deep, freeing up vauable bench space
  • PC connectivity - Simply transfer, analyse and document results

Applications

Consumer Electronics, Defence, Military & Aerospace, Embedded Design & Development, Hobby & Education, Test & Measurement, Portable Devices

Contents

Probes, power cord, accessory tray, protective front cover and NIST - traceable certificate of calibration.

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