2606B

Four-channel system SourceMeter® SMU instrument unit. Built from Keithley’s third generation SMU technology, the 2606B offers the combined capabilities of a precision power supply, true current source, 6½-digit DMM, arbitrary waveform generator and pulse generator all into one tightly integrated instrument. The result is a powerful solution that significantly boosts productivity for demanding automated qualification and production testing for optoelectronic devices such as VCSELs/laser diodes used in 3D sensing, telecommunication and LEDs used in consumer products and automobiles, as well as integrated devices like analogue ICs, ASICs and system-on-a-chip (SOC) devices.

• Two-line vacuum fluorescent display (VFD) with keypad and rotary knob
• Front panel save and recall buttons
• 20V at 1A and 6V at 3A power envelopes, 20W and 0.015% DCV basic accuracy
• Up to 28 open drain digital I/O bits
• Correlated results to the 2602B System SourceMeter SMU instrument
• TSP technology embeds complete test programs inside instrument for best system-level throughput
• TSP-link expansion technology for multi-channel parallel test without a mainframe
• Front panel LAN (LXI-C), USB 2.0 TMC488 protocol and digital I/O interfaces
• Built-in web browser based software enables remote control through any browser
• 100VAC to 240VAC, 50Hz or 60Hz (auto sensing), 425VA maximum power supply

Applications

Test & Measurement

Contenu

SourceMeter SMU instrument, Operators and programming manuals, 2 LAN crossover cable (0.41m(16")), Shielded CAT5 crossover cable for TSP-link and direct Ethernet connection (1.5m (5ft)), Green and yellow ground cable (3m (120")), Eight-pin custom cable connector, Cable housing and strain relief (4 included), 25-pin D-shell connector kit (2 included), 1U fixed rack mount kit, Power line cord (country dependent).

Remarques

Calibration services available for this product. Choose from a Standard Certificated Service or an internationally recognised UKAS accredited calibration. Visit our calibration page for more details.