KIT33905D5EKEVBE

The KIT33905D5EKEVBE is an evaluation kit for MC33905 system basis chip Gen2 with high speed CAN and LIN interface. This kit supports the MC33905D5 and MC33904 devices, which are the second generation family of system basis chips, which combine several features and enhance present module designs. This EVB includes two I/O test points that can be configured to be pulled up to VSUP or pulled down to GND through a resistor and indicator LED. These are easily configured via jumper settings. The SBC can also be exercised in debug mode by simply populating a jumper. The devices work as an advanced power management unit for the MCU and additional integrated circuits such as sensors, CAN transceivers. They have a built in enhanced high speed CAN interface (ISO11898-2 and -5), with local and bus failure diagnostics, protection and fail safe operation mode. The SBCs may include one or two LIN 2.0 interfaces with LIN output pin switches.

• Nominal operating supply voltage range of 5.5V to 27V
• Individually routed power supply inputs for VSUP1 and VSUP2
• 5V/3.3V regulator for MCU with an external PNP ballast transistor to increase current capability
• Multiple CAN bus termination options supported via socket
• Two high/low side I/Os (SPI configurable) accessible through test points
• Status of I/O 0 and I/O 1 indicated by an LED (dependent on jumper configuration)
• Debug mode/watchdog configuration via jumper settings
• 3.3V or 5V output voltage test point VAUX (SPI configurable)
• 100mil 2x8 pin standard header connector for SPI communication
• 100mil 16 pin standard header connector for custom MCU board connections

Applications

Automotive, Communications & Networking, Industrial, Motor Drive & Control

Contenu

Assembled and tested evaluation board/module in anti static bag, Misc cables, CD.